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Problem of ensuring specified reliability indices when designing computation
components of the telecommunication systems built via use of a nanoscale electronic element
base is considered. Computer models of the computation components with neural network
architecture and integrated nanoscale titanium oxide-based memristors and nanoscale
graphene-based field-effect transistors are studied. Correlation between the physical and
information parameters, integrated into the system of nanoscale electronic elements, as well
as an impact of parameter variation on the system reliability, has been investigated.
Keywords: computing system, graphene, nanoscale, neural network, transistor |
full paper (pdf, 848 Kb)