Mater.Phys.Mech.(MPM)
No 1, Vol. 7, 2004, pages 67-71

ON THE NATURE OF LAYER SUBSTRUCTURE OF DOPED SILICON FILMS

V.M. Ievlev, E.V. Shvedov and G.V. Merkulov

Abstract

In the paper the mechanism of the formation of the layer substructure of As-doped crystallites of poly-Si films, formed during pyrolysis of silane, is discussed. It is shown that the possibility of the layer substructure formation is controlled by the process of surface diffusion of As atoms over the surface of the growing Si grain.

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