The Cu-containing polyacrylonitrile (PAN) thin films (0.04 - 0.6 µm thicknesses)
were fabricated using IR-pyrolysis in ambient argon in different temperature and time modes.
The films were studied by X-ray photoelectron spectroscopy (XPS), X-ray diffraction (XRD),
transmission electron microscopy (TEM) and atomic force microscopy (AFM). CuCl, Cu2O and
Cu crystalline inclusions were obtained in the nanocomposite films by XRD. The film
microstructure was analyzed by AFM and TEM: the typical morphology corresponds to
composite film with nanoparticles of 10 nm average size in the polymer matrix. The film
electrical resistance was in the range from 4.0ž102 to 2.7ž1011Ω. The Cu-containing PAN
nanocomposite films are promising for application as low-temperature NO2 sensor in
36.5 - 255 ppm concentration range.
Keywords: IR-pyrolized polyacrylonitrile; electroconductive organic polymers; gas-sensing materials; nanostructured films; AFM; XPS; XRD; TEM. |
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