|
We have developed a new method for characterizing the electronic
properties of organic thin films and interfaces for electronic device
applications. In this scanning tunneling microscope (STM)-based technique,
distance versus potential curves are collected at constant tunneling
current. Here the STM feedback mechanism causes the tip to penetrate the
organic material, allowing the injection barriers at interfaces and
charge-transport properties of the organic materials to be determined with
nanometer spatial resolution. Moreover, the technique is applicable to
organic single and multilayer thin-film samples. Results obtained on thin
films of tris(8-hydroxiquinolato)aluminum deposited on Au(111) and Ag(111),
and polymorphic copper phthalocyanine deposited on Au(111)substrates will be
presented.
|