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For the characterisation of micro- and nanostructures in bulk as well as in loose powder materials
the X-ray Line Profile Analysis (XPA) has proven to be an excellent method. In the last two decades not only
the evaluation procedures have been improved extensively, but also the instrumentation like X-ray generators,
monochromators and detectors have been developed further.
The application of XPA on a variety of nanostructured materials produced by different methods demonstrates the ability to characterise the micro-/nanostructure in terms of structural size and its distribution and lattice defect densities. |
full paper (pdf, 100 Kb)