| Double ion-beam sputtering has been used to fabricate nanocermet multilayers consisting of silver nanoparticles sandwiched between Si3N4 dielectric layers. The organization of the nanoparticles has been studied in detail by quantitative analysis of transmission electronic microscopy and atomic force microscopy images. Our results show that the nanoparticles deposited on a plane surface present an isotropic macroscopic in-plane organization while their vertical arrangement displays a topology-induced self-organization. The use of faceted alumina substrates with periodic hill-and-valley structures results in the formation of linear chains of silver particles along the valleys. In that case, transmission optical measurements reveal in-plane anisotropy. |
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