| The effect of ECAP technology with different number of passes on the structure of pure coarse grained copper is examined by means of EBSD technique. Profile and intercept counts are carried out in three mutually perpendicular planes and in several directions and the results are used to estimate (by means of stochastic geometry approaches) global 3D characteristics of multi-connected systems of grain and subgrain boundaries and grain junctions. Beside as-pressed specimens, also the specimens after annealing and after creep are examined. The relations between structural characteristics and results of creep experiments summarized in the Part I of the paper are discussed. |
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