| Nanocrystalline Mg samples were prepared by milling procedure in an inert atmosphere and subsequent compacted and hot extruded. The linear grain size of specimens used was estimated by X-ray line profile analysis to be about 100 nm. Compression testing was performed at temperatures from room temperature up to 300 °C. Rapid decrease of the yield stress as well as the maximum stress with temperature was observed. This decrease and the flat character of the stress strain curves at elevated temperatures indicate possible contribution of diffusion process/es and grain boundary sliding. Stress relaxation tests were conducted in order to analyse thermally activated processes occurring during plastic deformation. |
full paper (pdf, 86 Kb)