Results of the surface morphology study of elastic self-adhesive radiation shielding coatings by atomic force microscopy
Авторы:
M.E. Buzoverya, Yu.P. Scherbak, V.D. Cherkasov, Yu.V. Yurkin, V.V. Avdonin, D.L. Suntsov, V.O. Pilshchikov
Страницы:
117-122
ДОИ (doi):
Аннотация:
An algorithm for studying the structure of radiation shielding materials using the atomic force microscopy (AFM) method has been developed and described. Using the proposed method, the structure of tungsten-containing radiation shielding materials was studied and the difference in the microstructure of the samples and the nature of the distribution of the filler was revealed.
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