ipmash@ipme.ru | +7 (812) 321-47-78
пн-пт 10.00-17.00
Институт Проблем Машиноведения РАН ( ИПМаш РАН ) Институт Проблем Машиноведения РАН ( ИПМаш РАН )

МИНОБРНАУКИ РОССИИ
Федеральное государственное бюджетное учреждение науки
Институт проблем машиноведения Российской академии наук

МИНОБРНАУКИ РОССИИ
Федеральное государственное бюджетное учреждение науки
Институт проблем машиноведения Российской академии наук

The model for optimizing cutting parameters for processing products on metal-cutting machines

Авторы:
Irina Khrustaleva , Michail Khrustalev , Yana Brovkina , Vladimir Khokhlovskiy , Viacheslav Shkodyrev ,
Страницы:
111-122
Аннотация:

The paper discusses the issues of multi-criteria optimization of the process of manufacturing products on metal-cutting machines. The efficiency of the optimization process directly depends on its level of detail and the optimal set of targets and control parameters. The change in the structure and properties of a product during its manufacture can be represent-ed in the form of a hierarchical model based on the decomposition of the original goal, which must be achieved through the comprehensive optimization of individual elements of the process. Described herein is a multi-level hierarchical model for optimizing a machining process comprising five levels of control. The following control levels are identified: Technological Process, Processing Stage, Technological Operation, Process Transition, Work Stroke. For each structural element of the model, control parameters, specific optimization criteria are defined, and vector optimiza-tion criteria are formed. The practical implementation of the control model is presented on the example of optimization of the target indicators of the technologi-cal process of the ”Roller” product. Graph of change of object states in process of its manufacturing is pre-sented, optimal values of target indicators and cutting parameters are determined.

Файл (pdf):
01:12
167
Используя этот сайт, вы соглашаетесь с тем, что мы используем файлы cookie.