SR phase contrast imaging to address the evolution of defects during SiC growth
Year(s):
2011
Autors:
Argunova T.S. , d.o.p.a.m.s. Gutkin M.Yu. , Je J.H. , Mokhov E.N. , Nagalyuk S.S. , Hwu Y. ,
Name Publication:
Physica Status Solidi (A) Applications and Materials Science
Volume Publication:
208
Issue Publication:
4
Pages:
819 - 824