Structural characterization of GaN/AIN layers on 3C-SiC/Si(111) by TEM
Year(s):
2011
Autors:
Sorokin L.M. , Kalmykov A.E. , Myasoedov A.V. , Veselov N.V. , Bessolov V.N. , Feoktistov N.A. , d.o.p.a.m.s. Osipov A.V. , d.o.p.a.m.s. Kukushkin S.A. ,
Name Publication:
Journal of Physics: Conference Series
Volume Publication:
326
Issue Publication:
1 / 012015