White X-ray beam topography and radiography of Si 1-xGe x crystals bonded to silicon
Year(s):
2007
Autors:
Argunova T.S. , Yi J.M. , Jung J.W. , Je J.H. , Sorokin L.M. , d.o.p.a.m.s. Gutkin M.Yu. , Belyakova E.I. , Kostina L.S. , Zabrodskii A.G. , Abrosimov N.V. ,
Name Publication:
Physica Status Solidi (A) Applications and Materials Science
Volume Publication:
204
Issue Publication:
8
Pages:
2669 - 2674