Microstructure and strength of AlN-SiC interface studied by synchrotron X-rays
Year(s):
2017
Autors:
d.o.p.a.m.s. Gutkin M.Yu. , T.S. Argunova, K.D. Shcherbachev, J.H. Je, O.P. Kazarova, E.N. Mokhov
Quarter:
Q1
Name Publication:
J. Mater. Sci.
Issue Publication:
52(8)
Pages:
4244-4252