Sequential structural characterization of layers in the GaN/AlN/SiC/Si(111) system by X-ray diffract
Year(s):
2013
Autors:
Ratnikov V.V. , Kalmykov A.E. , Myasoedov A.V. , d.o.p.a.m.s. Kukushkin S.A. , d.o.p.a.m.s. Osipov A.V. , Sorokin L.M. ,
Name Publication:
Technical Physics Letters
Volume Publication:
39
Issue Publication:
11
Pages:
994 - 997