Microstructure and strength of AlN–SiC interface studied by synchrotron X-rays
Year(s):
2017
Autors:
Argunova T.S. , d.o.p.a.m.s. Gutkin M.Yu. , Shcherbachev K.D. , Je J.H. , Lim J.-H. , Kazarova O.P. , Mokhov E.N. ,
Name Publication:
Journal of Materials Science
Volume Publication:
52
Issue Publication:
8
Pages:
4244 - 4252