Investigation of the Hardness and Young’s Modulus in Thin Near-Surface Layers of Silicon Carbide fro
Year(s):
2020
Autors:
d.o.p.a.m.s. Osipov A.V. , c.o.p.a.m.s. Grashchenko A.S. , Gorlyak A.N. , Lebedev A.O. , Luchinin V.V. , Markov A.V. , Panov M.F. , d.o.p.a.m.s. Kukushkin S.A. ,
Name Publication:
Technical Physics Letters
Volume Publication:
46
Issue Publication:
8
Pages:
763 - 766