X-ray imaging and TEM study of micropipes related to their propagation through porous SiC layer/SiC
Year(s):
2004
Autors:
Argunova T.S. , d.o.p.a.m.s. Gutkin M.Yu. , Je J.H. , Sorokin L.M. , Mosina G.N. , Savkina N.S. , Shuman V.B. , Lebedev A.A. ,
Name Publication:
Materials Science Forum
Volume Publication:
457-460
Issue Publication:
I
Pages:
363 - 366